Description
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
Scores
CVSS v3
7.8
EPSS
0.0011
EPSS Percentile
29.8%
Attack Vector
LOCAL
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
CISA SSVC
Vulnrichment
Exploitation
none
Automatable
no
Technical Impact
total
Details
CWE
CWE-119
CWE-823
Status
published
Products (24)
qualcomm/fastconnect_6700_firmware
qualcomm/fastconnect_6900_firmware
qualcomm/fastconnect_7800_firmware
qualcomm/qcm5430_firmware
qualcomm/qcm6490_firmware
qualcomm/qcs5430_firmware
qualcomm/qcs6490_firmware
qualcomm/sc8280xp-abbb_firmware
qualcomm/sc8380xp_firmware
qualcomm/sdm429w_firmware
... and 14 more
Published
Feb 03, 2025
Tracked Since
Feb 18, 2026