CVE-2024-45573

HIGH

Product <Version - Memory Corruption

Title source: llm

Description

Memory corruption may occour while generating test pattern due to negative indexing of display ID.

Scores

CVSS v3 7.8
EPSS 0.0003
EPSS Percentile 9.8%
Attack Vector LOCAL
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

Classification

CWE
CWE-119 CWE-823
Status published

Affected Products (24)

qualcomm/fastconnect_6700_firmware
qualcomm/fastconnect_6900_firmware
qualcomm/fastconnect_7800_firmware
qualcomm/qcm5430_firmware
qualcomm/qcm6490_firmware
qualcomm/qcs5430_firmware
qualcomm/qcs6490_firmware
qualcomm/video_collaboration_vc3_platform_firmware
qualcomm/sc8380xp_firmware
qualcomm/sdm429w_firmware
qualcomm/snapdragon_429_mobile_firmware
qualcomm/snapdragon_7c\+_gen_3_compute_firmware
qualcomm/sc8280xp-abbb_firmware
qualcomm/wcd9370_firmware
qualcomm/wcd9375_firmware
... and 9 more

Timeline

Published Feb 03, 2025
Tracked Since Feb 18, 2026