Description
Memory corruption while handling test pattern generator IOCTL command.
Scores
CVSS v3
6.6
EPSS
0.0008
EPSS Percentile
23.0%
Attack Vector
LOCAL
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
CISA SSVC
Vulnrichment
Exploitation
none
Automatable
no
Technical Impact
partial
Details
CWE
CWE-823
Status
published
Products (4)
qualcomm/sdm429w_firmware
qualcomm/snapdragon_429_mobile_platform_firmware
qualcomm/wcn3620_firmware
qualcomm/wcn3660b_firmware
Published
Jun 03, 2025
Tracked Since
Feb 18, 2026