CVE-2024-53017

MEDIUM

Product Version - Memory Corruption

Title source: llm

Description

Memory corruption while handling test pattern generator IOCTL command.

References (1)

Scores

CVSS v3 6.6
EPSS 0.0003
EPSS Percentile 8.0%
Attack Vector LOCAL
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L

Classification

CWE
CWE-823
Status published

Affected Products (4)

qualcomm/sdm429w_firmware
qualcomm/snapdragon_429_mobile_platform_firmware
qualcomm/wcn3620_firmware
qualcomm/wcn3660b_firmware

Timeline

Published Jun 03, 2025
Tracked Since Feb 18, 2026